• Apr 24, 2017 News! Vol.6, No.4 has been indexed by EI (Inspec).   [Click]
  • Apr 24, 2017 News! Vol.6, No.3 has been indexed by EI (Inspec).   [Click]
  • May 24, 2017 News!Vol 7, No 2 has been published with online version 11 original aritcles from 6 countries are published in this issue   [Click]
General Information
    • ISSN: 2010-3697
    • Frequency: Bimonthly
    • DOI: 10.7763/IJMO
    • Editor-in-Chief: Prof. Adrian Olaru
    • Executive Editor: Ms.Yoyo Y. Zhou
    • Abstracting/ Indexing: Engineering & Technology Digital Library, ProQuest, Crossref, Electronic Journals Library, Google Scholar, EI (INSPEC, IET).
    • E-mail ijmo@iacsitp.com
Editor-in-chief
Prof. Adrian Olaru
University Politehnica of Bucharest, Romania
I'm happy to take on the position of editor in chief of IJMO. It's a journal that shows promise of becoming a recognized journal in the area of modelling and optimization. I'll work together with the editors to help it progress.
IJMO 2012 Vol.2(5): 609-612 ISSN: 2010-3697
DOI: 10.7763/IJMO.2012.V2.193

Enhanced Scan in Low Power Scan Testing

Sangeetha Upadhyayula

Abstract—A routing-aware architecture is introduced to reduce capture power and peak test power. For shifting of test data or capturing the test responses, only a subset of scan-flip flops are activated in any clock cycle. This process can effectively reduce the capture power and peak test power. In order to reduce routing overhead, two routing driven architectures were proposed. Increase in performance levels were observed in making the proposed scan architecture, more automatic, by automatic shifting of register which requires less number of signals. Results were obtained by experimenting to this proposed scan architecture in reducing capture power, peak test power, test data volume and test application cost.

Index Terms—Power, capture power, peak test power, automatic shift register, test application cost and test data volume.

S. Upadhyayula is with the Jawaharlal Nehru Technological University, Ananthapur, India (e-mail: sangeethaupadhyay@ gmail.com).

[PDF]

Cite: Sangeetha Upadhyayula, "Enhanced Scan in Low Power Scan Testing," International Journal of Modeling and Optimization vol. 2, no. 5, pp. 609-612, 2012.

Copyright © 2008-2015.International Journal of Modeling and Optimization. All rights reserved.
E-mail: ijmo@iacsitp.com