• May 15, 2019 News!Vol.7, No.5- Vol.8, No.4 has been indexed by EI (Inspec).   [Click]
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General Information
    • ISSN: 2010-3697  (Online)
    • Abbreviated Title: Int. J. Model. Optim.
    • Frequency: Bimonthly
    • DOI: 10.7763/IJMO
    • Editor-in-Chief: Prof. Adrian Olaru
    • Executive Editor: Ms.Yoyo Y. Zhou
    • Abstracting/ Indexing: ProQuest, Crossref, Electronic Journals Library, Google Scholar, EI (INSPEC, IET), EBSCO, etc.
    • E-mail ijmo@iacsitp.com
Editor-in-chief
Prof. Adrian Olaru
University Politehnica of Bucharest, Romania
I'm happy to take on the position of editor in chief of IJMO. It's a journal that shows promise of becoming a recognized journal in the area of modelling and optimization. I'll work together with the editors to help it progress.
IJMO 2013 Vol.3(1): 87-91 ISSN: 2010-3697
DOI: 10.7763/IJMO.2013.V3.241

Metrics for Measurement of Node Fault in Sigmoidal FFANNs

Amit P. Singh,C. S. Rai, and Pravin Chandra

Abstract—An important issue in the design of a neural network is the sensitivity of its output to input, and node fault. In this paper, new sensitive measures are proposed for node fault, specifically node stuck-at-zero fault. Correlation coefficient between empirical mean squared error and error due to proposed metric shows that the proposed metrics are significant metrics due to their statistical significance at 95% confidence level for node stuck-at-zero fault.

Index Terms—Sigmoidal feedforward neural network, node fault, fault metric, fault tolerance.

The authors are with the University School of Information & Communication Technology, Guru Gobind Singh Indraprastha University, Dwarka, Delhi, India (e-mail: aps.ipu@gmail.com; csrai_ipu@yahoo.com; chandra.pravin@gmail.com).

[PDF]

Cite: Amit P. Singh, C. S. Rai, and Pravin Chandra, "Metrics for Measurement of Node Fault in Sigmoidal FFANNs," International Journal of Modeling and Optimization vol. 3, no. 1, pp. 87-91, 2013.

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